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Other articles related with "pulse-width effects"：
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88502 |
Hui Li(李慧), Chang-Chun Chai(柴常春), Yu-Qian Liu(刘彧千), Han Wu(吴涵), Yin-Tang Yang(杨银堂) |
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Damage effects and mechanism of the silicon NPN monolithic composite transistor induced by high-power microwaves |
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Chin. Phys. B
2018 Vol.27 (8): 88502-088502
[Abstract]
(555)
[HTML 1 KB]
[PDF 1160 KB]
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